Making IoT performance testing configurations easier: increase test reliability

MachNation continues to make it easier and more reliable to conduct IoT performance testing and IoT simulations using MIT-E Pf, our software for IoT performance testing.

Check-out these great new IoT testing features in MIT-E Pf v1.3.

  • Global test configurations. We have implemented a straight-forward way to build a MIT-E Pf test template and specify the “speeds and feeds” of an IoT performance test configuration. These global configuration templates allow an enterprise to specify the simulated device quantity, frequency of messaging/queries, load size, and more using one global test config. We use pre-created objects to drop into the global test template. These objects shorten the time it takes to create a test template and reduces the probability of a configuration error. This new capability allows for faster test set-up and easy scenario building for enterprises that want to run the a performance test multiple times while changing one or more test parameters.
  • Enhanced job workflow management. A job workflow specifies the steps required to bring a test live in MIT-E Pf and run it. With our new enhanced job workflow management, we now have an automated error-checking process that finds configuration and resource errors in an enterprise’s particular test set-up before an actual test starts running. This automated error-checking process saves enterprises time and money by preventing a test from starting if there are errors in the workflow.

Talk with the testing experts at MachNation and learn how to make your end-to-end IoT solution perform as reliably as some of our other MIT-E Pf customers.

Learn more about MIT-E Pf and IoT performance testing made easy!

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